TEST SERVICES
Send us your chips and we handle the rest
10+ years of R&D experience in silicon photonics, lasers, and optical communications.
Take advantage of the fastest time to production and consult your results in real time as they become available.
Single-Die
One chip at a time
Choose from a wide variety of measurements either standard (IV Curves, …) or custom. For all sorts of chip types including SOI, SiN, III-V, LNOI, etc.
Multi-Die
100+ chips
simultaneously
As many individual chips as required. Get knowledge on assorted sets of chips, see performance variation on incremental designs, or even identical units.
Wafer-Level
Up to 300 mm
wafers
Evaluation of full production wafers and multi-project wafers. Get location-based yield variation data and learn about the accuracy of the fabrication process.
Electro-Optic
For all your common applications
RF
Get accurate RF measurements of your devices
Thermo-Optic
Discover heat-related impacts on your electro-optic components
Surface Coupling
Edge Coupling
Side or in-trench
Up to 4 probes simultaneously
Advanced Algorithms
Auto-alignment on devices, active tuning, use of predictive models to eliminate redundant tests. Deterministic position tracking for advanced navigation assistance.
Our cloud-based data storage solution enables real-time consultation of results as they become available. Analyse your data while we’re testing, no need to wait for a report.
Data System
High-Level Reporting
Automated post-treatment and analysis of accumulated data. Build custom predictive models based off previous runs. Get wafer-scale variation maps and updatable reports that include the latest data points.
Design For Test
Minimize test time by employing tested-and-proven design choices
R&D Chip Design
Our experience is your new tool to bring your ideas into functional prototypes
Product Development
Ramp up your testing capacity to transition from R&D designs to full production
Get a Quote
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