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TEST SERVICES

Send us your chips and we handle the rest

10+ years of R&D experience in silicon photonics, lasers, and optical communications.

Take advantage of the fastest time to production and consult your results in real time as they become available.

Single-Die

One chip at a time

Choose from a wide variety of measurements either standard (IV Curves, …) or custom. For all sorts of chip types including SOI, SiN, III-V, LNOI, etc.

Multi-Die

100+ chips

simultaneously

As many individual chips as required. Get knowledge on assorted sets of chips, see performance variation on incremental designs, or even identical units.

Wafer-Level

Up to 300 mm

wafers

Evaluation of full production wafers and multi-project wafers. Get location-based yield variation data and learn about the accuracy of the fabrication process.

Electro-Optic

For all your common applications

RF

Get accurate RF measurements of your devices

Thermo-Optic

Discover heat-related impacts on your electro-optic components

Surface Coupling

Edge Coupling

Side or in-trench

Up to 4 probes simultaneously

Advanced Algorithms

Auto-alignment on devices, active tuning, use of predictive models to eliminate redundant tests. Deterministic position tracking for advanced navigation assistance.

Our cloud-based data storage solution enables real-time consultation of results as they become available. Analyse your data while we’re testing, no need to wait for a report.

Data System

High-Level Reporting

Automated post-treatment and analysis of accumulated data. Build custom predictive models based off previous runs. Get wafer-scale variation maps and updatable reports that include the latest data points.

Design For Test

Minimize test time by employing tested-and-proven design choices

R&D Chip Design

Our experience is your new tool to bring your ideas into functional prototypes

Product Development

Ramp up your testing capacity to transition from R&D designs to full production

Get a Quote

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